The LCR-P1 is a pocket ESR meter and transistor tester that identifies transistors, diodes, Zener diodes, MOSFETs, JFETs, IGBTs, thyristors, capacitors, inductors and resistors with one press of the TEST button, showing the part type, pin order and key values on a 1.44 inch colour screen. Capacitors are measured from 25pF to 100mF with ESR and loss, resistors from 0.01Ω to 50MΩ.
Features and Benefits
- One button automatic identification - shows the component type and which pin is which, so unmarked parts can be sorted quickly
- Capacitance with ESR and Vloss - checks electrolytic capacitors for ageing, not just their value
- Resistance 0.01Ω to 50MΩ and inductance 10uH to 1000uH with DC resistance - covers most passives on the bench
- Separate Zener channel measuring 0.01V to 32V with its own supply - tests Zener and regulator diodes above the 4.5V limit of the main test area
- Swappable test boards: a lever socket for leaded parts and an SMD pad board - test through-hole and chip components
- Anti-burn protection - the tester discharges capacitors on insertion to help prevent damage
- NEC infrared remote decoding, PC data export and firmware upgrades - extra functions for remote control repair and logging
Applications
- Sorting salvaged, unmarked or suspect transistors and MOSFETs
- Checking capacitor ESR in power supply and home appliance repair
- Testing infrared remote controls that use the NEC protocol
- Product development, education and hobby electronics
In the box
1 x LCR-P1 tester, 1 x replaceable test board, 1 x USB data cable, 3 x test hooks, user manual and packing box.
Note: Discharge large or high voltage capacitors before testing and never test parts in a powered circuit. Infrared decoding reads NEC protocol remotes only.
Display: 1.44 inch colour screen. Identification: Automatic component type and pin order, one button test. Transistor: 10 < β < 600; hFE, Ube, Ic/Ie, Iceo, Ices, Uf. Diode: Forward voltage drop < 4.5V; junction capacitance, reverse leakage current. Zener (voltage regulator) diode: 0.01V to 4.5V on the 1-2-3 area, 0.01V to 32V on the K-A-A area. Field effect transistors: JFET, IGBT, MOSFET: gate capacitance, Id at Vgs, threshold voltage, Rds, protective diode Uf. Thyristors: Unidirectional and bidirectional SCR: turn-on voltage < 5V, gate trigger current < 6mA. Capacitance: 25pF to 100mF, with Vloss and ESR. Resistance: 0.01Ω to 50MΩ. Inductance: 10uH to 1000uH, with DC resistance. Battery test: 0.1V to 4.5V, voltage and polarity. Infrared decoding: NEC protocol: user code, data code and waveform. Range mode: Auto range. Protection: Anti-burn, capacitors discharged on insertion. Data export: To a computer over USB. Firmware upgrade: Supported. Model: LCR-P1. Dimensions: 71 x 87 x 28mm. Weight: Approx. 81g (printed on the retail box). Battery: 300mAh lithium, built in. Charging: USB Type-C, 5V/1A. Operating temperature: 0 to 40°C. Controls: TEST button, Zener button, IR-decoding and transistor mode switch. Test interfaces: Lever socket board and swappable SMD pad board, plus 3 test hooks. Package contents: Tester, replaceable test board, USB data cable, 3 test hooks, user manual, packing box. Q: Can the LCR-P1 measure capacitor ESR? A: Yes. In capacitor mode it shows the capacitance from 25pF to 100mF together with the loss coefficient (Vloss) and the equivalent series resistance (ESR).. Q: Can it test Zener diodes above 5V? A: Yes. Besides the 0.01V to 4.5V range on the main test area, a separate Zener channel with its own pre-measurement supply measures from 0.01V to 32V.. Q: Does it test SMD components? A: Yes. A replaceable SMD pad test board swaps with the lever socket, so SMD parts such as transistors, MOSFETs and capacitors can be placed directly on the pads.. Q: How is the LCR-P1 powered? A: By a built-in 300mAh lithium battery, charged through the USB Type-C port at 5V/1A.. Q: What does the infrared decoding do? A: Point a remote control at the tester and it shows the user code and data code with the infrared waveform. It reads NEC protocol remotes only..